Film Thickness Gauges Anti-Fog Coating

Minimum Hardware and Software Requirements

• Standard PC/Laptop with Windows 10 or Windows 11
• Graphics adapter with at least Full HD, higher resolution is recommended
• One available USB 2.0/3.x port

Mechanical Construction

• Desktop enclosures with 3U height, CE certificate, no cooling required
• Dimensions (H x W x D): ~ 150 x 195 x 265 mm, Weight: ~4.4 kg
• External power supply with 100/240 Volt auto-switch (in the scope of delivery)

TranSpec Lite – Desktop PDA-Spectrometers

• Industry standard FSMA connector for bifurcated fiber optics cable
• Spectrometer modules of Carl Zeiss, Germany, with holographic created concave diffraction grating
• Photodiode arrays with 1024, 512 or 256 pixels available, no cooling required
• Permanently adjusted module, no mechanically moveable parts, maintenance free!
• Module specific wavelength ranges:

190-1020 nm (MC-UVNIR), 360-780 nm (MC-VIS), 600-1020 nm (MC-NIR) and 300-1100 nm (MS-VIS)

• Module specific spectral pixel interval: 0.8 nm (MC-UVNIR, MC-VIS and MC-NIR) or 3.2 nm (MS-VIS)
• Module specific spectral resolution: 2.4 nm (MC-UVNIR, MC-VIS and MC-NIR) or 10 nm (MS-VIS)
• Absolute wavelength accuracy:  0.3 nm typically
• Temperature drift: typically < 0.005 nm / Kelvin typically

TranSpec Lite – Integrated Halogen Spectral Lamp

• Industry standard FSMA connector for bifurcated fiber optics cable
• Integrated mechanical shutter, manually or automatically switched by software
• Special 7 Watt miniature halogen bulb with high luminance
• Spectral output range: ~ 350 to 1200 nm
• Typical lifetime of the bulb: 1500 hours

FTM-ProVis Lite – Film Thickness Software

• Multi-threaded MDI-Application, detailed online-help, color printed user’s manual
• Evaluation of interference spectra with the help of a special Fast-Fourier-Transformation (FFT)
• New algorithm for high-precise sub-pixel determination of the FFT peak position (film thickness result)
• Accuracy typically within +/- 0.005 microns, repeatability typically within +/- 0.002 microns (standard WEG test)
• Real-time chart representation of Interference, FFT-Spectrum and Film Thickness Trend during measurement
• Consideration of refraction index and dispersion (Cauchy dispersion correction)
• Simultaneous measurement and film thickness evaluation of double layers possible
• Spectra recorder for data logging up to 100,000 thickness measurements