NANOPHOX
Model No. :
Brand : Sympatec
The NANOPHOX utilizes Photon Cross-Correlation Spectroscopy to analyze particle size and stability in the nanometer range, even within opaque or highly concentrated samples. This advanced system eliminates the effects of multiple scattering, ensuring high-resolution results for complex colloidal dispersions without requiring extreme dilution.
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Precise measurement of concentrated nanoparticle dispersions
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Integrated temperature control for stability analysis
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Broad range from sub nanometer scale
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− Features
- Concentration-independent characterisation of particle size and particle size distribution
- For nanoparticles in turbid suspensions and emulsions
- For analyses in research, development or quality laboratories
- Robust method for measuring ranges from 0.5 nm to 10,000 nm
- High signal quality due to 3D correlation with polarisation-separated Backscattering [patent pending]
- Simple sample preparation without dilution series | Elimination of sample preparation errors and sample contamination
- Measurability check of the sample before starting the measurement
- Short measuring times of < 1 – 3 min. typical
- Enables investigations of special effects such as particle-particle interactions and viscosity changes of highly concentrated samples
- High sensitivity for size changes and measurement of bimodal distributions
- Contactless measuring method for in-situ observations of stability or size changes, e.g., growth or crystallisation processes
- Direct measurement method of the stability, agglomeration and sedimentation of slightly charged (electrostatically stabilised) to non-charged (sterically stabilised) particles of turbid samples
+ Resources
Features
- Concentration-independent characterisation of particle size and particle size distribution
- For nanoparticles in turbid suspensions and emulsions
- For analyses in research, development or quality laboratories
- Robust method for measuring ranges from 0.5 nm to 10,000 nm
- High signal quality due to 3D correlation with polarisation-separated Backscattering [patent pending]
- Simple sample preparation without dilution series | Elimination of sample preparation errors and sample contamination
- Measurability check of the sample before starting the measurement
- Short measuring times of < 1 – 3 min. typical
- Enables investigations of special effects such as particle-particle interactions and viscosity changes of highly concentrated samples
- High sensitivity for size changes and measurement of bimodal distributions
- Contactless measuring method for in-situ observations of stability or size changes, e.g., growth or crystallisation processes
- Direct measurement method of the stability, agglomeration and sedimentation of slightly charged (electrostatically stabilised) to non-charged (sterically stabilised) particles of turbid samples
Technical Specifications
Application & Standards
Accessories
Software
FAQs
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